Electronic Design News

LogiScope Logic Analyzer

LogiScope transforms an iPhone, iPad or iPod into a 100MHz, 16 channel logic analyzer. Not only is it the most intuitive logic analyzer available, the triggering is so powerful you’ll be able to count the hair on your bug.

Product Highlights

• 100 MHz, 16 channel logic analyzer
• Two logic harnesses (each with 8 digital, 1 ground)
• Protocol decoding: I2C, SPI, UART, Parallel
• Works with 2.0v, 2.5v, 3.3v & 5.0v systems
• Portable: goes where you go
• Input voltage -0.5v to +7v
• Advanced...

High-Speed Memory Test System

Advantest Corporation today announced the availability of its next-generation high-speed DRAM test system, the T5511. The new system, which begins shipping this month, offers the industry’s fastest test speed of 8Gbps.

Diverse DRAMs, One Test Solution

Dynamic random access memory (DRAM) is the most commonly used type of commodity memory device for personal computers and workstations. It is also widely employed in servers and clients, and used extensively in graphics and mobile...

65 GHz Bandwidth Oscilloscope

LeCroy Corporation, a leading supplier of oscilloscopes, protocol analyzers and signal integrity test solutions, announced the addition of a 65 GHz oscilloscope module to the LabMaster 10 Zi modular oscilloscope platform and unveiled its roadmap to provide 100 GHz of real-time bandwidth in the LabMaster 10 Zi platform. The top-bandwidth increase to 65 GHz is made possible by outstanding results achieved with LeCroy’s 8HP Silicon Germanium (SiGe) chipsets, which are performing in the...

High-Speed PCI Arbitrary Waveform Generator

GaGe, a worldwide leader in the design and manufacture of high-performance PCI Express/PCI digitizer and oscilloscope cards, today announced the release of its new CompuGen CG4800 PCI Express arbitrary waveform generator.

The CG4800 is an exceptionally high-speed, 14-bit, four-channel digital-to-analog conversion (DAC) board that may be used as an arbitrary waveform generator, a stimulus device, or for generating multiple communication frequency bands. Each DAC can generate four simultaneous...

Fastest Real-Time Oscilloscopes 63-GHz

Agilent Technologies Inc. introduced Infiniium 90000 Q-Series oscilloscopes with industry-leading, real-time bandwidth of 63 GHz on two channels and 33 GHz on four channels. The new lineup includes 10 four-channel models ranging from 20 GHz to 63 GHz, all of which are bandwidth upgradeable. These new scopes deliver the lowest noise and have the lowest jitter measurement floor in the oscilloscope industry, ensuring superior measurement accuracy.

“The 90000 Q-Series represents another...

Low Cost USB 3.0 Analyzer

LeCroy Corporation, the worldwide leader in USB test solutions, today introduced a new USB 3.0 protocol analyzer designed to significantly lower the cost of developing and testing new SuperSpeed USB devices. Based on LeCroy’s Advisor T3 Standard Edition (currently the top selling USB 3.0 protocol analyzer), the new Basic model at $2995 provides the same lossless data capture with full support for USB 3.0, 2.0 and 1.1 analysis. Now that Intel is shipping USB 3.0 in their 7 Series Chipset, the...

PCI Express(r) 3.0 Flying Lead Probe

Agilent Technologies Inc. announced a new flying lead solder-down probe for PCI Express 3.0 protocol analysis. The new U4324A probe, for use with Agilent’s U4301A protocol analyzer module, is the industry’s most cost-effective solder-down probing solution.

“The PCI Express flying lead probe is designed for simplicity, flexibility and low cost,” said Rob Vezina, a PCI Express product marketing engineer at Agilent. “It cleanly captures 8.0 GT/s traces from the device under test while it...

Mapping Defects on Integrated Circuits

The Challenge:

Creating a system to localize failure mechanisms causing abnormal electrical behavior, including those linked to complex parameters (such as frequencies, amplitudes, and digital values contained in registers), in integrated circuits (ICs).

The Solution:

Improving a conventional faults mapping system using NI PXI hardware and the NI LabVIEW FPGA Module.

Fault localization is complex due to decreased individual pattern sizes, increased metallization levels, and decreased...