EEWeb Pulse Magazine
Issue 103, 2013
Interview with Jennifer Zhao – GM of System Management Products at NXP
NXP’s I2C GPIO Family
This new family of devices features Agile I/O, which helps integrate common system functions within the semiconductor.
Cloud-based Regression Testing for Chip Design
This test allows designers to spot last minute tweaks or design flaws in a module.
Sudoku: A Logical Test
How to build a Sudoku program using the Java coding language.
Challenges for ESD-Robust Design
An overview of design challenges in state-of-the-art analog technologies.