EEWeb Pulse Magazine

EEWeb Pulse Magazine

Issue 103, 2013

Jennifer Zhao

Interview with Jennifer Zhao – GM of System Management Products at NXP

NXP’s I2C GPIO Family

This new family of devices features Agile I/O, which helps integrate common system functions within the semiconductor.

Cloud-based Regression Testing for Chip Design

This test allows designers to spot last minute tweaks or design flaws in a module.

Sudoku: A Logical Test

How to build a Sudoku program using the Java coding language.

Challenges for ESD-Robust Design

An overview of design challenges in state-of-the-art analog technologies.

RTZ – Return to Zero Comic

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